Appeal No. 2005-1219 Application No. 09/774,192 The references of record relied upon by the examiner as evidence of obviousness are: Guo et al. (Guo) 5,944,899 Aug. 31, 1999 Yoshida 5,735,993 Apr. 7, 1998 Claims 28, 33-39 and 42 stand rejected under 35 USC § 103 as unpatentable over Guo in view of Yoshida. For the details of this rejection reference is made to the examiner’s Answer. For appellants’ response to the examiner’s rejection reference is made to the Brief and Reply Brief for the full details thereof. OPINION We have carefully reviewed the rejection on appeal in light of the arguments of the appellants and the examiner. As a result of this review, we have determined that the applied prior art establishes the prima facie obviousness of all the claims on appeal. Appellants have not furnished any further evidence rebutting the prima facie case. Therefore we affirm the rejection of all the claims on appeal. Our reasons follow. The following are findings of fact as to the scope and content of the prior art and the difference between the claimed subject matter and the prior art. Guo discloses an apparatus for processing a semiconductor wafer. Specifically, the device is for etching a wafer using a captive plasma. Guo uses a vacuum chamber 11 to receive a semiconductor wafer (not shown) on a conductive pedestal 22. Yoshida also discloses an apparatus to etch a semiconductor wafer. Yoshida, in the embodiment of Figure 7, discloses a chamber lid or wall with a Faraday shield or metallic plate 1a and a heater lb embedded therein. This embodiment of Yoshida also has an rf coil 1. Thus, Yoshida differs from the claimed subject matter in that, in Yoshida the heater and Faraday 2Page: Previous 1 2 3 4 5 NextLast modified: November 3, 2007