Ex Parte Lee et al - Page 16

          Appeal No. 2005-2284                                                        
          Application No. 09/748,589                                                  
               We agree with the examiner for the reasons supra, anent claim          
          135.  Therefore, we will sustain the rejection of claim 138 (Group          
          V) under 35 U.S.C. § 103.                                                   

               Since we have sustained each and every one of the examiner’s           
          rejections of claims 126-141 under 35 U.S.C. § 103, the examiner’s          
          decision is affirmed.                                                       

               No time period for taking any subsequent action in connection          
          with this appeal may be extended under 37 CFR § 1.136(a)(1)(iv).            

                                        AFFIRMED                                      



                         ERROL A. KRASS                )                              
                         Administrative Patent Judge   )                              
                                                       )                              
                                                       )                              
                                                       )                              
                                                       ) BOARD OF PATENT              
                         JERRY SMITH                   )     APPEALS                  
                         Administrative Patent Judge   )       AND                    
                                                       )  INTERFERENCES               
                                                       )                              
                                                       )                              
                                                       )                              
                         ALLEN R. MACDONALD            )                              
                         Administrative Patent Judge   )                              

          EAK/dal                                                                     
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