Ex Parte Dostalik et al - Page 2




          Appeal No. 2006-0473                                                        
          Application 10/430,558                                                      

               a single damascene layer coupled to said front-end                     
          structure;                                                                  
               a dual damascene layer coupled to said single damascene                
          layer, said dual damascene layer comprising trenches and vias               
          within a dielectric material; and                                           
               a dual damascene pattern liner coupled at least partially              
          between said vias and said dielectric material but not between              
          said trenches and said dielectric material.                                 
               The following references are relied on by the examiner:                
          Lim et al. (Lim)              6,380,084      Apr. 30, 2002                  
          Merchant et al. (Merchant)    6,686,662      Feb.  3, 2004                  
                                        (Filed May 21, 2002)                          
               Claims 1, 2, 4, 5, 8, 11, 12, 14 and 15 stand rejected under           
          35 U.S.C. § 102(b) as being anticipated by Lim.  As to all the              
          other claims on appeal, claims 3, 6, 7, 9, 10, 13 and 16 through            
          19, the examiner rejects these claims under 35 U.S.C. § 103.  As            
          evidence of obviousness, the examiner relies upon Lim in view of            
          Merchant.                                                                   
               Rather than repeat the positions of the appellants and the             
          examiner, reference is made to the brief (no reply brief has been           
          filed) for appellants’ positions, and to the answer for the                 
          examiner’s positions.                                                       












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