Ex Parte Cannata et al - Page 40



           Appeal No. 2006-1049                                                                     
           Application No. 09/667,826                                                               

                                            Appendix 1                                              
                                    Drawings of application, as filed                               
           Brief description of the drawings of Cannata et al., U.S. Patent 5,811,808, of which     
           the present applicants seek reissue (drawing sheets 1-3, 7, and 9 are attached).         
           Figure 1 is a block schematic drawing of an infrared focal plane array imaging           
           system in accordance with the present invention.                                         
           Figure 2 is a block schematic drawing of the focal plane array shown in Figure 1,        
           in accordance with the present invention.                                                
           Figure 3A is a schematic drawing illustrating the readout cell circuitry associated      
           with a single pixel of the focal plane array of Figure 2 in accordance with a            
           preferred embodiment of the present invention employing current biasing of a             
           microbolometer detector element.                                                         
           Figure 3B is the readout circuit of Figure 3A further including an offset correction     
           circuit in accordance with the present invention.                                        
           Figures 6A-6G are timing diagrams illustrating the timing signals employed in the        
           readout circuit.                                                                         
           Figure 7 is a graphical representation of an example of offset correction provided       
           for several pixels of the focal plane array in accordance with the present invention.    
           Figure 10 is an alternate embodiment of the offset correction circuit illustrated in     
           Figure 3 employing a network of fixed current sources.                                   
           Figure 11 is a schematic drawing of another alternate embodiment of the offset           
           correction circuit of Figure 3 employing a network of fixed current sources              
           switchably connected between the voltage source and the microbolometer detector          
           element.                                                                                 



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