Ex Parte Buie et al - Page 1



           The opinion in support of the decision being entered today was not         
           written for publication and is not binding precedent of the Board.         
                                                                                     

                      UNITED STATES PATENT AND TRADEMARK OFFICE                       
                                     __________                                       
                         BEFORE THE BOARD OF PATENT APPEALS                           
                                  AND INTERFERENCES                                   
                                     __________                                       
               Ex parte MELISA BUIE, BRIGITTE STOEHR and GUENTHER RUHL                
                                     __________                                       
                                Appeal No. 2006-1320                                  
                             Application No. 10/024,958                               
                                     __________                                       
                                      ON BRIEF                                        
                                     __________                                       

          Before KIMLIN, WALTZ and FRANKLIN, Administrative Patent Judges.            
          KIMLIN, Administrative Patent Judge.                                        
                                 DECISION ON APPEAL                                   
          This is an appeal from the final rejection of claims 1-24.                  
          Claim 1 is illustrative:                                                    
               1.    A method for processing a photolithographic                      
               reticle, comprising:                                                   
               positioning the reticle on a support member in a                       
               processing chamber, wherein the reticle comprises a metal              
               photomask layer formed on a silicon based substrate and a              
               patterned resist material deposited on the metal photomask             
               layer;                                                                 






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