Ex parte KUMAR - Page 3




          Appeal No. 95-3265                                                            
          Application 08/047,162                                                        

                    Claims 1 through 22 stand rejected under 35 U.S.C. 103              
          as unpatentable over Morishita.                                               
                    Reference is made to the brief and answer for the                   
          respective positions of appellant and the examiner.                           


                                        OPINION                                         
                    We reverse.                                                         
                    The examiner has the initial burden of presenting a                 
          prima facie case of unpatentability.  If the examiner does not                
          present a prima facie case of unpatentability, then, without                  
          more, the applicant is entitled to grant of the patent.  If that              
          burden is met, the burden of coming forward with evidence or                  
          argument shifts to the applicant.  After evidence or argument is              
          submitted by the applicant, patentability is determined on the                
          totality of the record, by a preponderance of the evidence with               
          due regard to the persuasiveness of the arguments.  In re                     
          Oetiker, 977 F.2d 1443, 1445, 24 USPQ2d 1443, 1444 (Fed. Cir.                 
          1992).                                                                        
                    The examiner's rejection relies on Morishita which the              
          examiner states, at page 4 of the answer,                                     
                    teaches as a background the well known                              
                    art of combining mask set databases of                              
                    different design rules to generate a new                            
                    mask set database for a more complex IC                             

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