Appeal No. 95-2576
Application 07/962,952
The invention relates to a method for testing an integrated
circuit device to determine if latent defects exist within the
device. Appellants disclose on page 3 of the specification that
the method includes applying a voltage to the integrated circuit
and controlling the voltage being applied to the integrated
circuit device as a function of the channel lengths.
The independent claim 1 is reproduced as follows:
1. A method for testing an integrated circuit device, said
integrated circuit device having a plurality of electronic
devices, each of said plurality of electronic devices having a
channel of a predetermined length, said testing method comprising
the steps of:
applying a voltage to said integrated circuit device;
and
controlling said voltage being applied to said
integrated circuit device as a function of channel
lengths.
The Examiner relies on the following references:
Groves et al. 4,588,945 May 13, 1986
Schinabeck 4,637,020 Jan. 13, 1987
Claims 3, 6, 8, 9 and 12 stand rejected under 35 U.S.C.
§ 112, second paragraph, for failing to particularly point out
and distinctly claim the subject matter which Appellants regard
as the invention. Claims 1 through 4, 6, 8, 10 and 12 stand
rejected under 35 U.S.C. § 103 as being unpatentable over Groves.
Claims 5, 7, 9 and 11 stand rejected under 35 U.S.C. § 103 as
2
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