Ex parte D'SILVA et al. - Page 11




          Appeal No. 95-4369                                                          
          Application 08/117,242                                                      

               The test for obviousness is not whether the features of a              
          secondary reference may be bodily incorporated into the structure           
          of the primary reference, nor is it that the claimed invention              
          must be expressly suggested in any one or all of the references.            
          Keller, 642 F.2d at 425, 208 USPQ at 881.  As already discussed,            
          the test is what the combined teachings of the references would             
          have suggested to those of ordinary skill in the art.  Here, the            
          collective teachings of Jowitt, Bowen, and Griffin would have               
          made up for the deficiencies of only Jowitt and Bowen insofar as            
          remotely locating the plasma source from the detector is                    
          concerned.  One with ordinary skill in the art would have known             
          that another way to operate Jowitt’s inductively coupled plasma             
          source and spectrometer is to have them connected through a fiber           
          optic cable.  The reasons for doing so need not be breath-taking            
          or lead to an impressive or fantastic result.  The mere knowledge           
          that an alternative exists is a sufficient lead to obviousness.             
               For the foregoing reasons, we sustain the rejection of                 
          claims 46, 48, 54, 56, 65, 71-72 and 81 as being unpatentable               
          over Jowitt, Bowen and Griffin.                                             
               Claim 52 further recites a "seal means attached to the                 
          housing [in the sampling probe] proximate to said opening for               
          engagement with the surface of the material to be sampled for               


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