Appeal No. 96-1983
Application No. 08/222,784
constitute all the claims in the application. An amendment
after final rejection was filed on May 08, 1995 but was denied
entry by the examiner [Paper no. 10].
The invention pertains to a circuit which identifies
defective redundant word lines in a Static Random Access
Memory (SRAM) macro provided with an Array Built-In Self-Test
(ABIST) unit and a redundant mechanism. Specifically, the
structure detects failures in a manner which permits a two-
pass fuse blow process. The second fuse blow can be performed
either in a manufacturing environment, before or after burn-
in, or in a system environment should electrical fuses be
available.
Representative claim 1 is reproduced as follows:
1. A circuit for allowing a two-pass fuse blow to an
integrated circuit of a memory type comprising:
i) memory means having a plurality of word lines,
said memory including:
a standard array,
a redundant array provided with redundant word
lines,
a decoder means coupled to said standard array, and
comparator means coupled to said redundant array and
to said decoder means;
2
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