Ex parte KOIKE et al. - Page 5




                  Appeal No. 96-2740                                                                                                                      
                  Application No. 08/242,602                                                                                                              


                  dimensions of the patterns based on differences in thermal expansion coefficients and                                                   
                  then aligning the centers of the patterns during the step of applying heat and pressure.                                                
                           Accordingly, we will not sustain the examiner’s rejection of claim 8 under 35 U.S.C.                                           
                  § 103.                                                                                                                                  
                           The examiner’s decision is reversed.                                                                                           
                                                                    REVERSED                                                                              



                                    ERROL A. KRASS                                        )                                                               
                                    Administrative Patent Judge                           )                                                               
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                                                                                          )   BOARD OF PATENT                                             
                                    MICHAEL R. FLEMING                                    )     APPEALS AND                                               
                                    Administrative Patent Judge                           )    INTERFERENCES                                              
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                                    STUART N. HECKER                             )                                                                        
                                    Administrative Patent Judge                           )                                                               

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