Ex parte MURAMATSU et al. - Page 6




                 Appeal No. 1997-1430                                                                                                                   
                 Application No. 08/225,756                                                                                                             


                 Betzig to supply the missing teaching of utilizing a hook-                                                                             
                 shaped probe configuration for passing light to or from a                                                                              
                 measured sample.  In support of the 35 U.S.C. § 103 rejection,                                                                         
                 the Examiner offers two separate rationales in support of the                                                                          
                 conclusion of obviousness.  Initially, the Examiner asserts                                                                            
                 (Answer, page 5, section C) the art recognized functional                                                                              
                 equivalence of Betzig’s hook-shaped probe and the probe                                                                                
                 illustrated in Figure 5 of Fujihira.  Secondly, the Examiner                                                                           
                 (Answer, page 5, section B) cites a passage from column 7 of                                                                           
                 Betzig which sets forth the advantages of a hook-shaped probe                                                                          
                 (i.e. the probe tip is exposed to the sample regardless of the                                                                         
                 orientation of the probe supporting structure) as a motivating                                                                         
                 factor for substitution of Betzig’s hook-shaped probe for the                                                                          
                 Figure 5 probe of Fujihira.  Barrett is additionally added to                                                                          
                 the combination as providing a teaching of vertically                                                                                  
                 vibrating an optical probe relative to a sample to be                                                                                  
                 measured.   In the Examiner’s view, the skilled artisan would3                                                                                                                      



                          3As correctly pointed out by Appellants (Brief, page 10),                                                                     
                 Barrett has been applied solely to address the vertical                                                                                
                 vibration feature, a feature which appears only in dependent                                                                           
                 claims 15, 22, and 29.                                                                                                                 
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