Appeal No. 1997-3434
Application No. 08/307,075
The disclosed invention relates to a method of measuring
the depth of interaction of an incident gamma ray within a
scintillating crystal of a gamma ray imaging detector via the
use of first and second arrays of photodiodes adjacent first
and second surfaces, respectively, of the scintillating
crystal.
Claim 8 is the only independent claim on appeal, and it
reads as follows:
8. A method of measuring the depth of
interaction of an incident gamma ray
within a scintillating crystal of a
gamma ray imaging detector, said interaction
resulting in the generation of a plurality
of scintillation photons, comprising the steps of:
providing a first array of photodiodes
adjacent a first surface of said
scintillating crystal so as to receive a
first portion of said plurality of
scintillation photons generated by said
interaction;
providing a second array of photodiodes
adjacent a second surface of said scintillating
crystal opposite said first surface so as
to receive a second portion of said plurality
of scintillation photons generated by said
interaction;
each of said photodiodes in said first
and second arrays generating an electrical
output signal proportional to the number
of scintillation photons received; and
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