Ex parte LEE - Page 1




                    THIS OPINION WAS NOT WRITTEN FOR PUBLICATION                      
          The opinion in support of the decision being entered today                  
          (1) was not written for publication in a law journal and                    
          (2) is not binding precedent of the Board.                                  
                                                            Paper No. 16              

                      UNITED STATES PATENT AND TRADEMARK OFFICE                       
                                    _____________                                     
                         BEFORE THE BOARD OF PATENT APPEALS                           
                                  AND INTERFERENCES                                   
                                    _____________                                     
                               Ex parte CHING-YING LEE                                
                                    _____________                                     
                                Appeal No. 1997-3489                                  
                               Application 08/430,467                                 
                                   ______________                                     
                                      ON BRIEF                                        
                                   _______________                                    

          Before HAIRSTON, SMITH, JERRY and LALL, Administrative Patent               
          Judges.                                                                     
          HAIRSTON, Administrative Patent Judge.                                      

                                 DECISION ON APPEAL                                   
               This is an appeal from the final rejection of claims                   
          1 through 15.                                                               
               The disclosed invention relates to a method for                        
          inspecting a silicon substrate of a semiconductor device for                
          aluminum spiking.                                                           

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