Appeal No. 1997-3668 Application 08/395,228 corner, and neither of the two cited references individually or combined shows such an overlap. Appellants state the Examiner admits that Murakami does not show an overlap, and Burger makes it clear in the manufacturing process described (column 4, lines 37-42, column 5, lines 7-9) that the two layers formed are always directly coincident or line-on-line for all regions, with no overlap. (Brief-pages 4 and 5.) The Examiner responds with a new position that Burger discloses a functional overlap, or alternatively, that Burger when modified by Murakami, results in an overlap. (Answer-page 5.) The Examiner explains the functional overlap as all resistive portions under the terminal portions L11, L12...L32 being effectively not present owing to the low conductivity of the contacts overlying the resistive portions. In the alternative, the Examiner’s resultant overlap is reasoned that employing the Murakami resistor pattern (R1, R2- -Figure 10) in place of the resistors of Figure 2 of Burger results in the claimed overlap because Burger’s terminal -5-Page: Previous 1 2 3 4 5 6 7 8 9 10 11 12 NextLast modified: November 3, 2007