Ex parte MAYO et al. - Page 6




          Appeal No. 1997-4107                                                        
          Application No. 08/510,730                                                  


          find that Daimon, U.S. Patent 5,302,479, dated April 12, 1994,              
          Column 4, lines 59-66, discloses the measurement of x-ray                   
          diffraction patterns using copper alpha radiation having a                  
          wavelength of 1.541 D.                                                      
               Based upon the above findings, the person skilled in the               
          art, to whom the disclosure in the specification is directed,               
          would have understood that the "Bragg angles" as used in the                
          claimed subject matter provide for measurements using copper                
          alpha radiation having a wavelength of 1.541 D.                             
          On this record, we conclude that the specification                          
          provides a reasonable standard for understanding the metes and              
          bounds of the term of the claimed subject matter when the                   
          claim is read in light of the specification as it would be                  
          interpreted by one of ordinary skill in the art.  See Seattle               
          Box Co. v. Industrial Crating & Packing, Inc., 731 F.2d 818,                
          826, 221 USPQ 568, 573-574 (Fed. Cir. 1983).  Accordingly, we               
          reverse the rejection of the examiner.                                      
                                      DECISION                                        
               The rejection of claims 1, 2, 5 through 17, and 19                     
          through 25 under 35 U.S.C. § 112, second paragraph as being                 


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