Ex parte MAYER - Page 1




          The opinion in support of the decision being entered today was not written for
                   publication and is not binding precedent of the Board.             

                                                            Paper No. 22              

                      UNITED STATES PATENT AND TRADEMARK OFFICE                       
                                    _____________                                     
                         BEFORE THE BOARD OF PATENT APPEALS                           
                                  AND INTERFERENCES                                   
                                    _____________                                     
                                Ex parte BERND MAYER                                  
                                   _____________                                      
                                Appeal No. 1998-2151                                  
                             Application No. 08/580,823                               
                                   ______________                                     
                                      ON BRIEF                                        
                                   _______________                                    

          Before THOMAS, HAIRSTON, and JERRY SMITH, Administrative                    
          Patent Judges.                                                              
          HAIRSTON, Administrative Patent Judge.                                      

                                 DECISION ON APPEAL                                   
               This is an appeal from the final rejection of claims 2                 
          through 11.                                                                 
               The disclosed invention relates to a process for                       
          detecting small irregularities on a conducting surface, and to              
          a process for high-resolution measurement of impedance and                  
          non-homogeneities in a surface.                                             








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