Appeal No. 1998-2151
Application No. 08/580,823
APPENDIX
9. A process for detecting small irregularities on a
conducting surface, comprising:
providing a first electrical cavity resonator having a
first open end and at least one additional electrical cavity
resonator having a second open end, the first open end
and the second open end having different dimensions;
exciting the resonators in the microwave region;
moving the resonators over the surface;
finding integrated surface impedance measurements over
the first open end and the second open end by variations in
Q-factors of the resonators in moving over the surface;
Fourier-transforming the impedance measurements; and
determining locations of the small irregularities by
correlating respective Fourier transforms;
whereby the locations are determined when the
irregularities are smaller than any resonator open end.
A1
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