Ex parte HURWITT et al. - Page 6




                Appeal No. 1998-2342                                                                              Page 6                  
                Application No. 08/505,739                                                                                                




                Tanaka and Hurwitt.  We agree with the Appellants that Tanaka and Hurwitt are not relevant to our                         

                consideration of the issues as these two references were added to the rejection to address the                            

                limitations found in dependent claims which stand or fall with claims 1, 14, and 20 (Brief, page 14).                     

                We also agree with the Appellants’ characterization of the rejection under §103 as treating Tepman and                    

                Sasaki as two primary references and not as one in view of the other (Brief, page 11).  Therefore, we                     

                will first address the issues as they apply to both anticipation and obviousness of claim 1 over Tepman                   

                and then address the issues as they apply to the obviousness of claim 1 over Sasaki.  Then we will                        

                progress to claims 14 and 20.                                                                                             

                Claim 1                                                                                                                   

                        “To anticipate a claim, a prior art reference must disclose every limitation of the claimed                       

                invention, either explicitly or inherently.”  In re Schreiber, 128 F.3d 1473, 1477, 44 USPQ2d 1429,                       

                1431 (Fed. Cir. 1997).  As recognized by Appellants, Tepman compensates for target erosion by                             

                maintaining a consistent distance between the substrate wafer and the target and thus maintains a                         

                consistent and predictable coating thickness from substrate wafer to substrate wafer over the useful life                 

                of the target (Brief, page 7, lines 16-19 citing Tepman, col. 3, lines 44-53).  Appellants acknowledge                    

                that Tepman progressively reduces target-to-substrate spacing as a function of target erosion as                          











Page:  Previous  1  2  3  4  5  6  7  8  9  10  11  12  13  14  15  Next 

Last modified: November 3, 2007