Appeal No. 1998-2472
Application No. 08/614,324
identifying a window of samples relative to the abnormal
value, and analyzing the window of samples with a neural
network. Claim 4 is illustrative of the claimed invention,
and it reads as follows:
4. A method for detecting defects in a disk drive
storage device, said disk drive storage device comprising at
least one disk, said method comprising the steps of:
deriving a test signal from said disk drive, said test
signal being indicative of a disk surface parameter to be
measured, said test signal varying as a function of at least
one input parameter over a range of values of said at least
one input parameter;
identifying a sample of said test signal exceeding a
predetermined threshold value to detect an abnormal value of
said test signal indicative of a parameter to be measured;
identifying a window of a plurality of samples of said
signal relative to said detected abnormal value in response to
detecting said abnormal value;
providing a neural network for receiving said identified
window of said plurality of samples including at least one
neural network data structure defining data path adaptive
weights for said disk drive storage device; and
analyzing said identified window of said plurality of
samples with said neural network to determine whether a
predefined defect exists in said disk drive storage device.
The prior art references of record relied upon by the
examiner in rejecting the appealed claims are:
Meyer 4,942,609 Jul. 17,
1990
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