Ex parte IYECHIKA et al. - Page 2




            Appeal No. 1999-2611                                                      
            Application No. 08/808,537                                                

                 The claimed invention relates to an electrode                        
            material applied to a III-V group semiconductor compound                  
            doped with p-type impurities.  The electrode material                     
            comprises an alloy of Au and at least one metal selected                  
            from the group consisting of Mg and Zn.  Appellants                       
            assert at pages 2 and 3 of the specification that this                    
            particular electrode material exhibits low contact                        
            resistance against a III-V group compound semiconductor,                  
            and can advantageously be employed as a light emitting                    
            device driven at low voltage and having a high luminance.                 
                 Claim 1 is illustrative of the invention and reads                   
            as follows:                                                               
                      1.  An electrode material applied to a III-V                    
                 group compound semiconductor expressed as a general                  
                 formula of In GA Al N, where x+y+z=1, 0<x<1, 0<y<1,                  
                              x  (  z                                                 
                 and 0<z<1, said compound semiconductor being doped                   
                 with p-type impurities, said electrode material                      
                 comprising an alloy of Au and at least one metal                     
                 selected from the group consisting of Mg and Zn,                     
                 wherein Mg is present in a concentration range of                    
                 from 0.1 to 2.5% by weight based on the electrode                    
                 material and Zn is present in a concentration range                  
                 of from 1 to 30% by weight based                                     
                 on the electrode material.                                           
                 The Examiner’s Answer cites the following                            
            references:                                                               
            Tonai                    5,047,832                 Sep. 10,               
                                                               1991                   
                                          2                                           





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