Ex parte ECONOMIKOS et al. - Page 3







            Appeal No. 1998-3071                                                                              
            Application 08/477,054                                                                            



            Thus, Sommerfeldt clearly suggests there, if not its entire discussion and the portions we        
            outlined at pages 6-9 of our original opinion, that plural integrated circuit chips or plural     
            chips may be embodied on the top surface of the Figure 1 device 10 in Sommerfeldt.                
                   At the bottom of page 6 of our original decision, we stated that the "entire depiction     
            in Figure 2 [of Sommerfeldt] may comprise a so-called ‘chip site.’  We therefore agree with       
            the examiner’s view expressed at the seventh page of the answer."  There, the examiner            
            states that "any group of these pads can be called a chip site."  It is appellants and not us     
            or the examiner at page 2 of the request that indicates that only two bonding pads may            
            constitute a chip site.  Appellants’ discussion in the remaining portion of the first alleged     
            error seems to be focused only upon a consideration of two bonding pads as a chip site.           
            The examiner seemed to be indicating that Sommerfeldt’s chip sites may be located                 
            anywhere.  It appears that appellants have attempted to set up a redherring argument only         
            to shoot it down.  We also indicated at the bottom of page 8 of our original opinion that         
            appellants’ discussion of chip sites in the paragraph                                             
            bridging specification pages 7 and 8 should not be considered to be sites for receiving           
            complete integrated circuits or chips themselves since they are merely described there to         
            receive discrete semiconductor devices.                                                           


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