Ex Parte SCHONER et al - Page 2




          Appeal No. 2001-0032                                                        
          Application No. 08/735,389                                                  


               6.  A method for producing a crystalline layer of SiC having           
          at least a region thereof doped with boron atoms, said method               
          comprising the steps of:                                                    
                    (a) implanting boron atoms into a layer of crystalline            
                         SiC;                                                         
                    (b) implanting carbon atoms into said layer in order              
                         to form more carbon interstitials than the amount            
                         of carbon vacancies present in SiC and in a manner           
                         such that said layer remains crystalline; and                
                    (c) heating said layer to anneal it in order to make              
                         said boron atoms electrically active; and                    
               wherein step (b) is performed at either one of the following           
          1) before, 2) after or 3) at the same time as step (a).                     

                                    THE REFERENCE                                     
          Baliga et al. (Baliga)           5,318,915           Jun. 7, 1994           
                                   THE REJECTIONS                                     
               The claims stand rejected as follows: claims 2-4, 6 and 7              
          under 35 U.S.C. § 112, first paragraph, written description                 
          requirement, and claims 2-4 and 6 under 35 U.S.C. § 102(b) as               
          anticipated by Baliga.                                                      
                                       OPINION                                        
               We reverse the aforementioned rejections.                              
                           Rejection under 35 U.S.C. § 112                            
               The examiner argues that “[t]here is no explicit or implicit           
          disclosure of ‘implanting carbon atoms into SiC layer in a manner           



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