Appeal No. 2001-0032 Application No. 08/735,389 6. A method for producing a crystalline layer of SiC having at least a region thereof doped with boron atoms, said method comprising the steps of: (a) implanting boron atoms into a layer of crystalline SiC; (b) implanting carbon atoms into said layer in order to form more carbon interstitials than the amount of carbon vacancies present in SiC and in a manner such that said layer remains crystalline; and (c) heating said layer to anneal it in order to make said boron atoms electrically active; and wherein step (b) is performed at either one of the following 1) before, 2) after or 3) at the same time as step (a). THE REFERENCE Baliga et al. (Baliga) 5,318,915 Jun. 7, 1994 THE REJECTIONS The claims stand rejected as follows: claims 2-4, 6 and 7 under 35 U.S.C. § 112, first paragraph, written description requirement, and claims 2-4 and 6 under 35 U.S.C. § 102(b) as anticipated by Baliga. OPINION We reverse the aforementioned rejections. Rejection under 35 U.S.C. § 112 The examiner argues that “[t]here is no explicit or implicit disclosure of ‘implanting carbon atoms into SiC layer in a manner Page 2Page: Previous 1 2 3 4 5 6 7 8 NextLast modified: November 3, 2007