Ex Parte BUPP et al - Page 2




          Appeal No. 2001-1305                                                        
          Application 08/872,782                                                      


          an organic carrier (card platform) mounting an I/C chip and                 
          mounted on a substrate according to the present invention.  See             
          page 6 of the Appellants’ specification.  Figure 1 shows                    
          dielectric layers 6 and 7, as well as dielectric layers 2 and 3.            
          These dielectric layers are composite materials having a                    
          uoropolymer matrix, such as a PTFE matrix, containing, as a                 
          filler ingredient, ceramic particulate filler, such as silica               
          (e.g., amorphous fused silica powder).  See pages 7 and 8 of the            
          Appellants’ specification.  Appellants recognize that the problem           
          with these ceramic filler layers is that they allow corrosion               
          when exposed to process chemicals such as resist strippers. See             
          page 8 of Appellants’ specification.  Appellants solve this                 
          problem by providing PTFE layers 8 and 9.  The PTFE barrier                 
          layers 8 and 9 are free of ceramic components and additives, such           
          as silica or glass, and like materials which are not chemically             
          inert to the presence of standard processing chemicals used to              
          lipographically define fine line circuitry, electrical                      
          interconnection pads, and the like.  The fluoropolymer barrier              
          layers 8 and 9 consist essentially of fluoropolymer, i.e., while            
          it is preferred to use a 100% pure fluoropolymer material in                
          barrier layers 8 and 9, the presence of merely trace amounts of             
          impurities of ceramics in layers 8 and 9 is also within the scope           
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