Ex Parte CHENG et al - Page 2




          Appeal No. 2001-1421                                                        
          Application No. 09/128,226                                                  


               The claimed invention relates to an underfilling method for            
          a flip-chip packaging process in which an underfill material                
          layer is initially formed over bumps on a semiconductor                     
          substrate.  A die sawing process is then performed to form a                
          plurality of dies followed by a flip-chip process on each the               
          dies to adhere the dies to another substrate.  According to                 
          Appellants (specification, page 3), because the underfill                   
          material is coated from the top of the bumps before the flip–chip           
          process, the problem of air being trapped between the die and the           
          adhered substrate can be eliminated.  In addition, Appellants               
          assert that process time is shortened since underfill material is           
          dispensed over all of the dies before die sawing in contrast to             
          the conventional underfilling process in which underfill material           
          needs to be dispensed and the edges sealed on each individual               
          die.                                                                        
               Claim 1 is illustrative of the invention and reads as                  
          follows:                                                                    
               1.  An underfilling method for a flip-chip packaging                   
          process, the method comprising:                                             
               providing a first semiconductor substrate, wherein the first           
          semiconductor substrate has at least a plurality of pads and a              
          passivation layer, wherein the passivation layer is formed over             
          the substrate but exposes the pads, and wherein the passivation             
          layer is thicker than the pads;                                             

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