Ex Parte KONDO et al - Page 2




             Appeal No. 2002-0376                                                                             
             Application No. 09/072,137                                                                       


                   Appellants’ invention relates to an integrated circuit device, arrangement/wiring          
             method thereof, arrangement/wiring apparatus thereof, and recoding medium.   The                 
             invention uses a compaction process which operates to reduce the minimum chip area               
             necessary to accommodate the components and routing lines of the device.  The                    
             compaction process uses a standard density value to determine when the compaction                
             process is complete.  An understanding of the invention can be derived from a reading            
             of exemplary claim 1, which is reproduced below.                                                 
                   1.    An arrangement/wiring method of an integrated circuit device for                     
                   arranging cells each containing at least one element and wiring signal                     
                   lines which connect the cells in the integrated circuit device, said                       
                   arrangement/wiring method comprising the steps of:                                         
                         performing a compaction process so as to reduce a chip area of                       
                   said integrated circuit device in which the cells have been arranged and                   
                   the signal lines have been wired while fulfilling design rules;                            
                         obtaining a standard value of element density which is previously                    
                   stored in a storage means and indicates a number of elements per unit                      
                   area, and comparing said standard value with said element density of said                  
                   integrated circuit device to which the compaction process has been                         
                   executed; and                                                                              
                         repeating the compaction process when said element density is                        
                   smaller than said standard value, and terminating the compaction process                   
                   when said element density is larger than said standard value.                              
                   The prior art of record relied upon by the examiner in rejecting the appealed              
             claims is as follows:                                                                            




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