Appeal No. 2002-0880
Application No. 09/183,214
test parameters. Each of the sets of test parameters is associated with one or more of
the products to be tested by the automated test system 10. See page 8 of Appellants’
specification.
The processor 16 is operable to receive input from the input device 30, including
input identifying a product model identifier. The processor 16 is further operable to
retrieve from the storage device 12 the set of test parameters associated with the
product model identifier. The product is further operable to retrieve from the storage
device 12 the set of test parameters associated with the product model identifier. The
processor is still further operable to generate a control signal that includes the retrieved
set of test parameters. See page 11 of Appellants’ specification. The test apparatus
18 is a device operable to perform product testing by applying an input to a DUT and
measuring a quantity from the DUT. The test apparatus 18 is operably connected to
receive the test parameters from, and to provide test result data to the processor 16.
To this end, the test apparatus 18 in the embodiment described herein is coupled to the
processor 16 through the I/O circuitry 28 and communicates with the processor 16 over
a I.E.E.E. 488 link 17.
Independent claims 1 and 8 are representative of Appellants’ claimed invention,
and are reproduced as follows:
3
Page: Previous 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 Next
Last modified: November 3, 2007