Appeal No. 2002-0880
Application No. 09/183,214
1. A method of testing a device using a test apparatus, the device
having a circuit connection and a ground connection, the test apparatus
operable to generate voltages at select levels and for select times based
on test parameters, the method comprising:
a) obtaining input from an operator defining a first product model
identifier from a plurality of product model identifiers;
b) retrieving from a memory one of the plurality of sets of test
parameters associated with the first product model identifier;
c) causing the test apparatus to execute a first test based on the
retrieved set of test parameters by providing a control signal to the test
apparatus over a communication link; and
d) obtaining test results from the test apparatus.
8. An automated test system for testing a device, the device having a
circuit connection and a ground connection, the automated test system
comprising
a storage device operable to store a plurality of sets of test
parameters, the storage device further operable to store a plurality of
product model identifiers, each product model identifier associated with
one of the plurality of sets of test parameters;
a display;
an input device for obtaining input from an operator defining a first
product model identifier from the plurality of product model identifiers;
a processor, coupled to the input device, the display and the
storage device, the processor operable to cause the display to display the
plurality of product model identifiers for selection by the operator; the
processor further operable to receive the input from the input device and
retrieve the set of test parameters associated with the first product model
identifier from the storage device based on the input; the processor further
operable to generate a control signal that includes the retrieved set of test
parameters;
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