Appeal No. 2003-0196
Application No. 08/601,258
is adjusted by controlling either the temperature at which the
platinum film is heat-treated after formation, the thickness of the
platinum film, or the duration of the heat treatment (id.).
Appellants state that the claims on appeal stand or fall
together (Brief, page 3). Since the examiner has selected claim 7
as representative of the grouped claims (Answer, page 3), we also
select this claim from the grouped claims and decide the ground of
rejection in this appeal on the basis of this claim alone. See
37 CFR § 1.192(c)(7)(2000). Of course, since claim 11 is the
subject of a separate ground of rejection (Answer, page 4), we
consider claim 11 in deciding this ground of rejection. See In re
McDaniel, 293 F.3d 1379, 1383, 63 USPQ2d 1462, 1465 (Fed. Cir.
2002). Representative claim 7 is reproduced below:
7. A method of adjusting a temperature coefficient
of resistance of a temperature-measuring resistive element having
an electrically insulating base and a noble metal film formed on
the base, the method comprising the steps of:
forming a noble metal film by sintering a noble metal
compound located on an electrically insulating base; and
controlling at least one of a thickness of the
noble metal film, a temperature at which the noble metal film is
heat-treated and the length of time that the noble metal film is
heat-treated after formation of the noble metal film on the
electrically insulating base so as to adjust the temperature
coefficient of resistance of the noble metal film.
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