Ex Parte O'REILLY et al - Page 7



          Appeal No. 2004-0227                                                        
          Application 09/140,151                                                      

               As pointed out by the examiner (answer, page 3), Verschuur             
          does not store the measured variations in capacitance and compare           
          later-measured information to the stored information.  Instead,             
          Verschuur compares measured information to previously-stored                
          information about similar patterns.  This indicates that                    
          Verschuur’s statement that “the information can be verified”                
          (col. 8, line 12) does not pertain to security information which,           
          it reasonably appears, would require comparison not merely with             
          similar information but, rather, with the information exactly as            
          it should be.  The examiner has not provided evidence or                    
          technical reasoning which shows that Verschuur’s comparison with            
          similar patterns is applicable to security information.                     
               Thus, to arrive at the appellants’ claimed invention, one of           
          ordinary skill in the art would have had to modify Verschuur’s              
          system and method, in view of Brosow and Stockburger, such that             
          dielectric particles are formed on the contents of Verschuur’s              
          envelope in a random distribution in addition to the pattern of             
          Verschuur’s bar-code or conventional or self-defined symbols,               
          capacitance variation information about that random distribution            
          is measured and stored, in addition to Verschuur’s information on           
          similar patterns being stored, the same random distribution, in             
          addition to Verschuur’s pattern other than the similar pattern,             
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