Ex Parte GUSLER et al - Page 4



          Appeal No. 2003-1515                                                        
          Application No. 09/364,014                                                  

               We agree with Appellants that the claim does require that              
          the level of risk associated with the sub-system be measured by a           
          risk test which, in effect, is subjecting the sub-system to a               
          test or procedure for establishing the risk.  Although the claim            
          does not recite executing the risk test whether or not a failure            
          occurs, as argued by the Examiner (answer, page 5), the step of             
          executing a sub-system risk test, as correctly defined by                   
          Appellants, does clearly require that the system be subjected to            
          a procedure for evaluating risk.                                            
               Having established the meaning of the claimed term, we now             
          address the arguments related to the teachings of the reference             
          relied on by the Examiner.  Initially, it is noted that a                   
          rejection for anticipation under section 102 requires that each             
          and every limitation of the claimed invention be disclosed in a             
          single prior art reference.  In re Paulsen, 30 F.3d 1475, 1478-             
          79, 31 USPQ2d 1671, 1673 (Fed. Cir. 1994).  See also Atlas Powder           
          Co. v. Ireco Inc., 190 F.3d 1342, 1347, 51 USPQ2d 1943, 1947                
          (Fed. Cir. 1999).                                                           
               We observe that Skeie relates to a method for analyzing a              
          storage system and how partial or full failure of one component             
          adversely affects the system operation and notifying the user of            
          the component failure, its criticality and its effect on data               
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