Ex Parte Ooi et al - Page 3



          Appeal No. 2005-0779                                                        
          Application No. 09/802,084                                                  

                                       OPINION                                        
               For the reasons set forth below, these rejections cannot be            
          sustained.                                                                  
               On pages 3-4 of the answer, the examiner expresses his                 
          anticipation finding with respect to appealed claim 1 (the sole             
          independent claim before us) in the following manner:                       
                    Pertaining to claim 1, see FIGS. 1-5, where Burnham               
               teaches a method of manufacturing a photonic integrated                
               circuit comprising a compound semiconductor structure having           
               a quantum well region 54, comprising the steps of                      
               irradiating the structure using a source of photons (i.e.,             
               laser, column 2, lines 1-5) to generate defects, the photons           
               having an energy (E) at least that of the displacement                 
               energy (E[D]) of at least one element of the compound                  
               semiconductor, and subsequently annealing the structure to             
               promote quantum well intermixing.                                      
               In support of their contrary view, the appellants argue that           
          the Burnham patent contains no disclosure concerning the appealed           
          claim 1 steps of irradiating a semiconductor structure “to                  
          generate defects” and “subsequently annealing the structure.”               
          More specifically, the appellants acknowledge that Burnham                  
          irradiates his semiconductor structure with a laser beam but                
          point out that this laser beam irradiation is for the purpose of            
          creating thermally disordered areas as opposed to generating                
          defects as here claimed.  The appellants additionally point out             
          that the Burnham method does not include an annealing step                  

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