Ex Parte Landau et al - Page 5

          Appeal No. 2005-0789                                                             
          Application No. 10/410,000                                                       

          substrate [emphasis added], and that Watson does not suggest                     
          this aspect of the claimed invention.                                            
                On page 7 of the answer, the examiner argues that Watson                   
          teaches electroplating on a conductive panel (brass panel).  The                 
          examiner therefore equates this with electroplating a conductive                 
          seed layer, and the examiner states that a seed layer is usually                 
          utilized when electroplating copper on a semiconductor                           
          substrate.                                                                       
                We first note that appellants’ claim 1 uses the word                       
          “comprising”, which is an open-ended term.  As such, appellants’                 
          claim 1 can also include electrodeposition of a metal on a seed                  
          layer.                                                                           
                Watson’s brass panel is preplated with a seed layer of                     
          copper.  See column 10, lines 39-42.  Hence, Watson teaches to                   
          use a plating solution for electrodeposition on a seed layer.                    
          Also, as stated by the examiner on page 5 of the answer, the                     
          seed layer, being conductive, would enable improved                              
          electroplating of copper onto the underlying substrate (whether                  
          the substrate is a brass panel or some other material such as a                  
          semiconductive substrate).  Given the fact that it was common in                 
          the industry to use a metal seed layer on a semiconductor                        
          substrate, we agree with the examiner that use of the plating                    
          solution of Watson to conduct such a process would have been                     
          obvious.                                                                         
                In view of the above, we therefore affirm the 35 U.S.C.                    
          § 103 rejection of claims 1-13 and 15-24.                                        






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