Appeal No. 96-1990 Application 07/536,910 receiving a set of one or more model symbols; and generating a set of defective pixel representations of the symbols from the set of model symbols in response to the defect class parameters, the defective pixel representations including pixel representation defects belonging to the defect classes specified by the defect class parameters. 20. Apparatus for generating examples of defective pixel representations of symbols comprising: means for receiving a set of one or more defect class parameters selected by a user of the apparatus from a plurality thereof, each defect class parameter specifying a class of pixel representation defects; a set of one or more model symbols; and means for making a set of defective pixel representations of the symbols from the set of model symbols in response to the defect class parameters, the defective pixel representations including pixel representation defects belonging to the classes specified by the defect class parameters. Independent claims 34 and 38 are similar to claims 6 and 20 insofar as the generation of defective pixel representations are concerned. However, claims 34 and 38 further use the defective pixel representations to "infer" a classifier. Opinion We do not sustain the rejection of claims 6-34, 36-38 and 3Page: Previous 1 2 3 4 5 6 7 8 9 NextLast modified: November 3, 2007