Appeal No. 96-1990
Application 07/536,910
receiving a set of one or more model symbols; and
generating a set of defective pixel
representations of the symbols from the set of model symbols in
response to the defect class parameters, the defective pixel
representations including pixel representation defects belonging
to the defect classes specified by the defect class parameters.
20. Apparatus for generating examples of defective
pixel representations of symbols comprising:
means for receiving a set of one or more defect
class parameters selected by a user of the apparatus from a
plurality thereof, each defect class parameter specifying a class
of pixel representation defects;
a set of one or more model symbols; and
means for making a set of defective pixel
representations of the symbols from the set of model symbols in
response to the defect class parameters, the defective pixel
representations including pixel representation defects belonging
to the classes specified by the defect class parameters.
Independent claims 34 and 38 are similar to claims 6 and 20
insofar as the generation of defective pixel representations are
concerned. However, claims 34 and 38 further use the defective
pixel representations to "infer" a classifier.
Opinion
We do not sustain the rejection of claims 6-34, 36-38 and
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