Appeal No. 95-3898
Application 08/156,953
DECISION ON APPEAL
Appellants have appealed to the Board from the examiner’s
final rejection of claims 1 to 8, which constitute all the
claims in the application.
Representative claim 1 is reproduced below:
1. A device comprising a substrate and a plurality of
compositionally distinguishable thin film layers formed on
said substrate characterized in that at least one layer of
said plurality comprises an epitaxial region of Sr Ca RuO
x 1-x 3
where O#x#1 wherein said region has essentially isotropic
electrical conductivity.
The following references are relied on by the examiner:
Hoekje et al. (Hoekje) 3,990,957 Nov. 9,
1976
Kidoh, et al. (Kidoh), “Ferroelectric Properties of Lead-
Zirconate-Titanate Films Prepared by Laser Ablation,” Appl.
Phys. Lett., vol. 58, pp. 2910-2912, June 24, 1991.
Lichtenberg, et al. (Lichtenberg), “Sr RuO : A Metallic
2 4
Substrate for the Epitaxial Growth of Yba Cu O ,” Appl. Phys.
2 3 7-*
Lett., vol. 60, pp. 1138-1140, March 2, 1992.
Claims 1 to 8 stand rejected under 35 U.S.C. § 103. As
evidence of obviousness, the examiner relies upon Hoekje in
2
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