Ex parte MCCLELLAND - Page 2




          Appeal No. 95-3942                                                          
          Application No. 08/008,976                                                  


               6.  A lithography process for defining features on a                   
          workpiece comprising directing a beam of metastable rare gas                
          atoms onto a surface of a lithographic resist so that the                   
          metastable rare gas atoms strike the surface of said lithographic           
          resist whereby internal energy of said metastable rare gas atoms            
          is released.                                                                
               In the rejection of the appealed claim, the examiner relies            
          upon the following reference:                                               
          McMillan                    4,746,799                May 24, 1988           
               Appellant relies upon the following reference as evidence of           
          nonobviousness:                                                             
          Saita et al. (Saita)        4,974,227               Nov. 27, 1990           
               Appellant's claimed invention is directed to a lithographic            
          process which comprises exposing a lithographic resist to a                 
          directed beam of metastable rare gas atoms.  According to                   
          appellant, the use of metastable rare gas atoms is an improvement           
          over the prior art use of visible, UV and X-ray radiation because           
          it allows for an exposed pattern of finer dimension.  For                   
          instance, whereas the smallest spot size attainable by visible              
          light, UV radiation and X-rays is 200-300 nm, about 100 nm and              
          about 30 nm, respectively, metastable rare gas atoms provide                
          small spot sizes on the order of 1.3 nm.  Also, while the prior             
          art use of electrons and ions as exposing radiation results in              
          the smallest feature sizes of 2 nm and 20 nm, respectively, the             
          use of electrons and ions as exposing radiation does not allow              

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