Ex parte FUSE et al. - Page 2




          Appeal No. 96-1536                                                          
          Application 08/136,241                                                      
          examiner's refusal to allow claims 1 through 3, all the claims              
          remaining in appellants' application for reissue of U.S.                    
          Patent 5,057,444, which issued on October 15, 1991.                         
                    The appealed subject is directed to a process for                 
          the preparation of various semiconductor devices.                           
                    Claim 2, which is illustrative of the claimed                     
          process, is reproduced below for a more facile understanding                
          of appellants' invention.                                                   
                    2.  A method of fabricating a trench capacitor                    
                    comprising:                                                       
                    a step of forming a trench in a semiconductor                     
                    substrate having a principle [sic, principal]                     
                    surface, said trench having four sidewalls which                  
                    extend into said substrate in a direction                         
                    perpendicular to said principal surface of said                   
                    semiconductor substrate and which are perpendicular               
                    to each other, and said trench having a bottom                    
                    parallel to said principal surface;                               
                    a step                                                            
                    of forming an outer electrode including,                          
                                                                                     
          (a) a step of positioning said semiconductor                                
          substrate           in a first position;                                    
                                                                                     
                                                                                     
                    (b) a step of implanting ions into a first side-wall              
          of        said side-walls of said trench from a direction                   
                    inclined to a normal to a plane containing said                   
                    principal surface of said semiconductor substrate;                
                                                                                     
                    (c) a step of positioning said semiconductor                      
          substrate           in a second position which is different                 
          from said first     position by rotating said semiconductor                 
          substrate by        90E about an axis of rotation which is                  
                                          2                                           





Page:  Previous  1  2  3  4  5  6  7  8  9  Next 

Last modified: November 3, 2007