Ex parte LIU et al. - Page 2



          Appeal No. 97-1387                                                          
          Application No. 08/251,011                                                  

               The invention is directed to a semiconductor device as                 
          set forth in independent claim 1, reproduced as follows:                    
               1. A semiconductor device comprising:                                  
               a support structure formed of an electrically insulating               
          layer on a semiconductor material base of a first conductivity              
          type;                                                                       
               a plurality of field-effect transistors including first                
          and second field-effect transistors comprising:                             
               first and second semiconductor material substrates for                 
          said first and second field-effect transistors, respectively,               
          that are  substantially crystalline and provided spaced apart               
          from one another on said electrically insulating layer with                 
          each having a central portion thereof of said first                         
          conductivity type, said first semiconductor material substrate              
          having a pair of terminating regions of said first                          
          conductivity type separated by said central portion thereof                 
          each having a greater conductivity than said central portion,               
          said second semiconductor material substrate having a pair of               
          terminating regions of a second conductivity type separated by              
          said central portion thereof;                                               
               first and second gate oxide layers provided on at least                
          said first and second semiconductor material substrate central              
          portions, respectively; and                                                 
               first and second gate semiconductor structures of a                    
          common conductivity type provided on said first and second                  
          gate oxide layers across from said first and second                         
          semiconductor material substrate central portions,                          
          respectively.                                                               
               The examiner relies on the following references:                       




                                                                                                                                                                
          ' 112, second paragraph, was withdrawn by the examiner in the               
          answer.                                                                     

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