Ex parte SHOR et al. - Page 12




          Appeal No. 96-4052                                                          
          Application 08/198,511                                                      

          show contact between Ti and SiC.  On this point we agree with               
          appellants.  The examiner has not shown the claimed contact                 
          structure on SiC.  Nor has the examiner explained why one of                
          ordinary skill in the art would have been motivated to use the              
          contact structure of Steitz.  Appellants use the contact                    
          structure to provide stability to the contact (e.g.,                        
          specification, page 13, lines 31-34), whereas Steitz discloses              
          that the plurality of metals enhances bonding (col. 3,                      
          lines 41-46).  Thus, we see no motivation to combine the                    
          teachings of Steitz with Forrest.  The rejection of claims 36               
          and 38 is reversed.  Since claim 37 depends on claim 36, the                
          rejection of claim 37 is also reversed.                                     

          Claims 40-44 and 46                                                         
               This group of claims is directed to masking.  The                      
          examiner states that "Kohl et al uses a mask for the light in               
          photo-electrochemical etching" (FR2; EA3) and concludes that                
          it would have been obvious "to use a light mask, as taught by               
          Kohl" (FR3; EA3).                                                           
               Appellants argue that Kohl is directed to III-V and II-VI              
          semiconductors and that "[t]he Forrest et al. patent fails to               
          disclose a masking process for use with a SiC semiconducting                
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