Appeal No. 1997-1038
Application 08/077,926
Representative claim 1 is reproduced below:
1. A semiconductor device comprising
(a) a semiconductor circuit which is an object of a test,
(b) an input terminal means receiving an input signal to the semiconductor circuit
during an ordinary operation,
(c) an output terminal receiving an output signal from the semiconductor circuit
during the ordinary operation,
(d) a power terminal applying a specified potential to the semiconductor circuit
during the ordinary operation, and
(e) a mode switching circuit interposed between the input terminal means and the
semiconductor circuit for switching its operation from the test to the ordinary operation;
wherein
the mode switching circuit (e-1) applies the input signal received on the input
terminal to the semiconductor circuit during the ordinary operation and
(e-2) applies at least one specified fixed value to the semiconductor circuit during
the test and, wherein the mode switching circuit receives a test signal which is activated
during the test and deactivated during the ordinary operation,
wherein the input terminal includes first and second input terminals;
and wherein the at least one specified fixed value includes first and second fixed
values,
the mode switching circuit includes a first gate for outputting the first fixed value
regardless of a value of a signal applied to the first input terminal during the test and a
second gate for outputting the second fixed value regardless of a value of a signal applied
to the second input terminal during the test and
wherein the test signal takes the first fixed value when activated or otherwise take
the second fixed value when deactivated
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