Ex parte JOSEPH - Page 10




          Appeal No. 97-1631                                         Page 10           
          Application No. 08/245,267                                                   


               Further comparison of the claim’s language to the                       
          reference’s teachings evidences that Abe also fails to teach                 
          or suggest the claimed receiving means and the step of                       
          receiving light.  The claimed indicia are read “using                        
          information from the at least one coded symbol.”  In contrast,               
          Abe uses light reflected by the alignment marks to detect a                  
          positional deviation between the mask and wafer.  Therefore,                 
          we find that Abe, alone or in combination with Guthmueller,                  
          fails to teach or suggest the masking means and receiving                    
          means and the steps of positioning masking means and receiving               
          light as specified in claims 1 and 20, respectively.                         


               Regarding the Badgley reference, we find that the                       
          reference fails to teach or suggest the claimed receiving                    
          means and step of receiving light.  Badgley relates to the                   
          selection of recorded data optically.  Col. 1, ll. 1-3.  It                  
          detects coincidence between apertures formed in a master                     
          record strip, which bear indicia of a characteristic sought,                 
          and those formed in a scanning strip, which bears indicia of                 
          the characteristics available.  Id. at ll. 42-48.  The strips                
          are superimposed and then disposed to intercept a beam of                    







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