Appeal No. 1997-3134
Application 08/434,163
canceled.
The invention relates to the field of microprocessors and more particularly to a technique of
providing internal access to the microprocessor through a standardized test access port.
On page 5 of the specification, Appellants disclose that external access to internal low level structures
of a microprocessor allows for flexibility in performing diagnostics on a microprocessor which ultimately
reduces time required to test and debug the microprocessor.
On pages 9 and 10 of the specification, Appellants disclose that figure 1 shows an access test port unit
11. On page 11 of the specification, Appellants disclose that the test access port unit 11 is coupled to
a control register unit 13. Appellants further disclose that control register unit 13 is coupled to control
buses 15 and 16 to allow access to control registers 14 of the microprocessor 10. Appellants disclose
on page 12 that the circuit shown in figure 1 allows data to be written into the control registers of the
microprocessor or read from the control register microprocessor through a serial port provided into the
test access port unit 11.
Independent claim 1 is reproduced as follows:
1. A microprocessor providing external diagnostic access comprising:
a plurality of control registers;
an internal bus coupled to said control registers;
a test access port (TAP) configured to receive external programming signals in a serial format;
2
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