Appeal No. 1997-3134
Application 08/434,163
second register to said one of said control registers specified by said address responsive to said first
instruction command; in a read operation, said control register unit causing data to be transferred from
said one of said control registers to said second register responsive to said first instruction command."
We note that independent claim 15 recites similar language. Appellants argue that Andrews does not
read from or write to any component outside of the TAP or the TAP's internal TDRs. Appellants
further pointed out that Swoboda does not teach accessing control registers for reading or writing
either.
In response to Appellants' argument that Andrews teaches away from the claimed invention, the
Examiner responds on page 8 of the Examiner's answer stating that Andrews does teach a TAP having
registers BICSC and ITV TDR for testing. The Examiner further argues that these registers are not
excluded from the inclusion of the use of TAP for functional testing. In response to Appellants'
argument that the references do not teach reading from or writing to the control register, the Examiner
responds by arguing that although Andrews does not explicitly teach reading from or writing to the
control register, Andrews does suggest that boundary scan registers BSR apply a test vector at
selected input or nodes of the CMOS modules during a test mode. The Examiner argues that it would
been obvious to one of ordinary skill art in the art to realize that the features of writing to and reading
from the CMOS modules are encompassed during applying test vector to the CMOS modules during
testing.
5
Page: Previous 1 2 3 4 5 6 7 8 9 Next
Last modified: November 3, 2007