Appeal No. 1996-2956
Application 08/152,192
The invention relates to a testing and finishing
system for integrated circuit package units (ICPUs). In
particular, Appellant discloses on page 2 of the specification
that the present invention has integrated all individual
operations into one assembly linking all the equipment and
stations together forming an auto-test and finishing system.
A copy of independent claim 27 is attached to this decision.
The Examiner relies on the following references:
Wilkin et al. (Wilkin) 3,842,957 Oct. 22, 1974
Swapp et al. (Swapp) 4,776,747 Oct. 11, 1988
Takemoto et al. (Takemoto) 4,850,103 July 25, 1989
Pearson 4,878,801 Nov. 7, 1989
Nara 4,969,199 Nov. 6,
1990
Yonemura 58-18930 Jan. 3, 1983
(Japanese Patent)
Kodama 60-161629 Aug. 23, 1985
(Japanese Patent)
Yabe 60-153133 Aug. 12,
1985
(Japanese Patent)
Noguchi 61-30041 Feb. 12, 1986
(Japanese Patent)
Fukui 62-86832 Apr. 21, 1987
(Japanese Patent)
Matsunaga 63-257250 Oct. 25, 1988
(Japanese Patent)
2
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