Ex parte HUAT - Page 11




          Appeal No. 1996-2956                                                        
          Application 08/152,192                                                      

                                      APPENDIX                                        

               27.  A method of testing, marking, sorting and packing                 
          different classification of integrated circuit package units                
          (ICPUs) that are initially enclosed in carrier tubes                        
          comprising,                                                                 
               a) automatically positioning carrier tubes containing                  
          ICPUs in a position that locates the ICPUs in a dead bug                    
          orientation,                                                                
               b) automatically moving the carrier tubes with the ICPUs               
          in the previously positioned dead bug orientation to a                      
          conditioning station,                                                       
               c) automatically unloading the ICPUs from the carrier                  
          tubes at the conditioning station in the dead bug orientation               
          such that the ICPUs are unenclosed, and automatically                       
          conditioning the individual, unenclosed ICPUs with heat,                    
               d) automatically transporting the conditioned ICPUs,                   
          while unenclosed and in the dead bug orientation, from the                  
          conditioning station to an environmental test station and                   
          automatically testing the electrical parameters of the                      
          conditioned ICPUs at the environmental test station while the               
          ICPUs are in the dead bug orientation,                                      
               e) automatically cooling the conditioned and unenclosed                
          ICPUs while the ICPUs are in the dead bug orientation and                   
          automatically transporting the cooled ICPUs, while the ICPUs                
          are unenclosed and in the dead bug orientation, from the                    
          environmental test station to an ambient temperature test                   
          station,                                                                    
               f) automatically testing the cooled ICPUs at the ambient               
          temperature test station for quality assurance while the ICPUs              
          are unenclosed and in the dead bug orientation and thereafter               
          automatically transporting the quality tested ICPUs, while                  
          unenclosed and in the dead bug orientation, from the ambient                
          temperature test station to an orientation station,                         

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