Appeal No. 1997-1425
Application No. 08/520,228
machine’s operating parameters in response to the substrate’s
surface roughness and to its thickness.
Representative independent claim 33 is reproduced as
follows:
33. A method of marking a substrate, comprising:
(a) moving a substrate from a substrate holder to a
catch tray;
(b) recording a latent image on a photoconductive
surface;
(c) developing the latent image with toner;
(d) transferring the developed toner from the latent
image to the substrate;
(e) fusing the transferred toner layer on the substrate;
(f) generating a roughness signal as a function of the
substrate roughness;
(g) generating a thickness signal as a function of the
substrate thickness;
(h) producing a process control signal as a function of
the roughness signal and the thickiness signal[.];
and
(j) controlling at least one of the steps of (c), (d),
and
(e) as a function of the process control signal.
The Examiner relies on the following references:
Jakeman et al. 3,971,956 Jul. 27, 1976
Wong et al. 5,138,178 Aug. 11, 1992
2
Page: Previous 1 2 3 4 5 6 7 8 9 10 11 12 Next
Last modified: November 3, 2007