Appeal No. 1997-2112
Application No. 08/398,831
each Edge-Under-Test (EUT) Unique I/O Sequence (UIO) Set
corresponds to an Edge-Under-Test (EUT),
each Set of Edge-Under-Test (EUT) Unique I/O Sequence
(UIO) Sets consists of Edge-Under-Test (EUT) Unique I/O
Sequence (UIO) Sets corresponding to the same Edge-Under-Test
(EUT), and
all Edges-Under-Test (EUT) have corresponding I/O
Sequences;
(b) selecting one Edge-Under-Test (EUT) Unique I/O
Sequence (UIO) Set from each Set of Edge-Under-Test (EUT)
Unique I/O Sequence (UIO) Sets to form a plurality of Selected
Edge-Under-Test (EUT) Unique I/O Sequence (UIO) Sets, wherein:
each member of each of the plurality of Selected Edge-
Under-Test (EUT) Unique I/O Sequence (UIO) Sets is a Selected
Edge-Under-Test (EUT) I/O Sequence; and
(c) constructing for storage in a memory a plurality of
Test Sequences (TS), wherein:
each Test Subsequence (TS) comprises one Selected Edge-
Under-Test (EUT) I/O Sequence and the I/O Sequence
corresponding to the Edge-Under-Test (EUT) corresponding to
the Selected Edge-Under-Test (EUT)Unique I/O Sequence (UIO)
Set containing the Selected Edge-Under-Test (EUT) I/O
Sequence;
each Test Subsequence (TS) is a Second Sequentially
Ordered Series of I/O Sequences corresponding to a Second
Ordered Sequence of State Transitions (TR), and
each said Test Subsequence (TS) starts at a Test
Subsequences (TS) First State and ends at a Test Subsequences
(TS) Last State.
The examiner relies on the following reference:
Dahbura et al. (Dahbura) 4,991,176 Feb. 5,
1991
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