Appeal No. 1997-2112
Application No. 08/398,831
the Selected Edge-Under-Test (EUT) Unique I/O Sequence (UIO)
Set containing the Selected Edge-Under-Test (EUT) I/O
Sequence,” along with two further statements limiting the step
or means for constructing a plurality of test subsequences.
The recitation apparently relates to the second step (set
forth on page 5 of the Answer) that is purportedly not taught
by the reference: “constructing a test subsequence for storage
in a memory.” (Answer, page 5.) However, the claims are more
specific than merely “constructing a test subsequence”; the
claims recite how a plurality of test subsequences are
constructed.
The findings concerning motivation to modify the
reference are also deficient. Most seem to be based on the
explicit disclosure of Dahbura, and yet the modifications
depart from the teachings of the reference. While we tend to
agree with the general statements such as “breaking a problem
into its component parts improves upon the controllability of
test generation” (Answer, page 6), the generalities do not
address the claims at issue. We would agree that breaking a
problem into smaller parts may have been obvious to the
artisan. However, the claims are specific with regard to how
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