Appeal No. 1997-3443
Application No. 08/595,901
(b) an electrically conductive material extending into said lattice
structure, said electrically conductive material forming an ohmic
contact with said substrate and damaging said lattice structure by
extending into said lattice structure to provide by said damage an
n-type region in said substrate in said damaged lattice region and
in a regions [sic] adjacent to and intimate with said electrically
conductive material within said lattice structure; and
(c) an electrical contact to the p-type substrate.
The references relied upon by the examiner as evidence of obviousness are:
Wotherspoon 4,411,732 Oct. 25, 1983
Baker 4,521,798 Jun. 04, 1985
Mc Adoo et al. (Mc Adoo) 5,451,769 Sep. 19, 1995
Claims 13, 14, 19, 20, 25 and 26 stand rejected under 35 U.S.C. § 102(b) as being
anticipated by Baker.
Claims 13-16, 19-22 and 25-28 are rejected under 35 U.S.C. § 103 as being unpatentable
over Baker in view of Mc Adoo.
The respective positions of the examiner and the appellant with regard to the propriety of
these rejections are set forth in the final rejection (Paper No. 7) and the examiner’s answer and
supplemental answer (Paper Nos. 11 and 13, respectively) and the appellant’s brief and reply
briefs (Paper Nos. 10, 12 and 14, respectively).
Appellant’s Invention
As noted in the examiner’s answer, the summary of the invention contained in the
brief is correct. Reference is made to that summary.
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