Appeal No. 1998-1657 Page 15
Application No. 08/674,282
that the word lines WL and WLC are connected to memory cells
400 and 500 rather than to sense amplifier 504.
Similarly, Figure 2a of Young shows word line WL
connected to elements 21a, 21b, 24a, and 24b. As evidenced by
Leung and contrary to the examiner's allegation, therefore,
persons skilled in the art would interpret the elements as
forming a memory latch rather than a sense amplifier latch.
Also contrary to the examiner's allegation, such persons would
then interpret elements 25, 27, and 28 as the "local or column
sense amplifier," col. 1, ll. 65-66, shown in the Figure
rather than as a local column read amplifier. In summary, the
examiner fails to show that Young teaches a local column read
amplifier let alone such an amplifier coupled to data read
lines and to an internal node of a sense amplifier latch. He
fails to allege, let alone show, that Toshiba remedies the
defect of Young.
Because Young omits a local column read amplifier, we are
not persuaded that teachings from the prior art would have
suggested the limitations of "a plurality of column read
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