Ex Parte EDLINGER et al - Page 9




          Appeal No. 2000-0038                                                        
          Application 08/751,369                                                      


          page 17) that Heming does not disclose the recited materials                
          other than SiO2 is irrelevant.                                              
                                      Claim 23                                        
               The appellants argue that Heming does not disclose                     
          depositing the waveguide layer at low temperature using reactive            
          sputtering (brief, pages 17-18).  Heming’s teachings that the               
          synthetic resin substrate is to be heated to a temperature which            
          is lower than its glass transition temperature (col. 3, lines 26-           
          27), and that some of the synthetic resins have long term usage             
          temperatures below 100ºC (col. 4, lines 25-26 and 51-54), would             
          have fairly suggested, to one of ordinary skill in the art,                 
          carrying out any of the disclosed waveguide layer formation                 
          processes, including ion-enhanced PVD (col. 6, line 18), at a               
          sufficiently low temperature, such as a temperature below 100ºC,            
          to avoid thermally damaging the synthetic resin substrate.                  
                                      Claim 27                                        
               The appellants argue that Heming does not relate the                   
          disclosure of low absorbance of the intermediate layer (col. 8,             
          lines 37-38) to the substrate characteristics (brief, page 18).             
          The appellants do not specify in their specification how much               
          lower the propagation attenuation of the intermediate layer must            
          be relative to that of the substrate to be “substantially lower”            
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